Segment Anything in Defect Detection
Bozhen Hua,b, Bin Gaoc,
Cheng Tanb, Tongle Wud, and Stan Z. Lib
a Zhejiang University, Zhejiang, China; b Westlake University, Zhejiang, China;
c University of Electronic Science and Technology of China, Chengdu, China;
d Pennsylvania State University, School of Electrical Engineering and Computer Science
[email protected], bin[email protected],
[email protected], [email protected], [email protected] Corresponding author
a Zhejiang University, Zhejiang, China; b Westlake University, Zhejiang, China;
c University of Electronic Science and Technology of China, Chengdu, China;
d Pennsylvania State University, School of Electrical Engineering and Computer Science
[email protected], bin[email protected],
[email protected], [email protected], [email protected] Corresponding author