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Screening effects of superlattice doping on the mobility of GaAs two-dimensional electron system revealed by in-situ gate control

T. Akiho and K. Muraki NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi 243-0198, Japan
Abstract

We investigate the screening effects of excess electrons in the doped layer on the mobility of a GaAs two-dimensional electron system (2DES) with a modern architecture using short-period superlattice (SL) doping. By controlling the density of excess electrons in the SL with a top gate while keeping the 2DES density constant with a back gate, we are able to compare 2DESs with the same density but different degrees of screening using one sample. Using a field-penetration technique and circuit-model analysis, we determine the density of states and excess electron density in the SL, quantities directly linked to the screening capability. The obtained relation between mobility and excess electron density is consistent with the theory taking into account the screening by the excess electrons in the SL. The quantum lifetime determined from Shubnikov-de Haas oscillations is much lower than expected from theory and did not show a discernible change with excess electron density.

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I I. INTRODUCTION

High-mobility two-dimensional electron systems (2DESs) in AlGaAs/GaAs heterostructures are the basic platform to test new concepts and study emergent phenomena in low-dimensional systems. The modulation doping technique that separates the channel and the doping layer for carrier supply Pfeiffer and West (2003); Umansky et al. (2009); Gardner et al. (2016); Manfra (2014); Chung et al. (2020) and advances in molecular-beam epitaxy that enable the residual impurity concentration to be decreased are the key ingredients in realizing clean 2DESs. Over the years, improvements in sample quality, manifested as higher mobility, have led to the discovery of new transport phenomena Willett et al. (1988); Goldman et al. (1990); Lilly et al. (1999); Du et al. (1999); Suen et al. (1992) and correlated phases including the fractional quantum Hall effects (FQHEs) Tsui et al. (1982); Willett et al. (1987). However, it has recently been recognized that not only mobility but also the screening of the long-range disorder potential caused by modulation doping is essential for the observation of fragile FQHEs such as the one at an even-denominator Landau-level filling factor ν=5/2\nu=5/2 Umansky et al. (2009); Pan et al. (2011); Gamez and Muraki (2013). Specifically, modulation doping in an AlAs/GaAs/AlAs short-period superlattice (SL) Friedland et al. (1996) or low-xx AlxGa1-xAs (x=0.24x=0.240.250.25) alloy Gamez and Muraki (2013) has been shown to be effective, where the electrons in the doped layer delocalize and screen the Coulomb potential from ionized donors.

The concept of SL doping where a δ\delta-doped donor layer is located within a narrow GaAs layer flanked by narrow AlAs layers was originally introduced by Friedland et al. to reduce remote-impurity scattering and thereby enhance mobility Friedland et al. (1996). In the AlAs/GaAs/AlAs SL, the energy level of the X-band formed in the AlAs layers is lower than that of the Γ\Gamma-band formed in the GaAs layer (inset of Fig. 1). Consequently, mobile electrons supplied from the donor layer accumulate not only in the GaAs quantum well (QW) several tens of nanometers away but also in the neighboring AlAs layers. The SL doping technique was later applied to ultra-high-quality samples with mobility exceeding 10×10610\times 10^{6} cm2/Vs, where its impact on the FQHEs has been demonstrated Pfeiffer and West (2003); Umansky et al. (2009); Gardner et al. (2016); Manfra (2014); Chung et al. (2020). Recently, effects of excess electrons in the SL on mobility and the quantum scattering lifetime have been studied theoretically Sammon et al. (2018a, b). Experimentally, gating of samples with SL doping has been attempted to examine the influences of the parallel conducting layer on mobility Friedland et al. (1996); Rössler et al. (2010); Dmitriev et al. (2012); Peters et al. (2017). However, uncontrollable charge redistribution and hysteresis that accompany the SL doping Rössler et al. (2010) have made it difficult to extract quantitative information such as the density of excess electrons in the SL.

Refer to caption
Figure 1: Magnetotransport properties, RxxR_{xx} (red) and RxyR_{xy} (black), of the Hall bar measured at 1.6 K. Insets show the schematic layer structure of the sample and Γ\Gamma-conduction band edge profile. The X- and Γ\Gamma- conduction band edge profiles near the AlAs/GaAs/AlAs superlattice are shown on an enlarged scale in the dashed box.

In this study, we vary the excess electron density in the SL in a controlled manner by appropriately choosing the temperature at which the gate voltage is swept. This enabled the in situ control of disorder screening. We determined the electron density in the SL as a function of gate voltage by using a field-penetration technique Eisenstein et al. (1994) and circuit-model analysis, which also allowed us to estimate the quantum capacitance, or the density of states (DOS), in the SL. We show that the obtained relation between mobility and excess electron density can only be explained by theory taking into account the screening by excess electrons.

II II. EXPERIMENT and ANALYSIS

II.1 A. Sample characterization

The sample consisted of a 30-nm-wide GaAs QW sandwiched between Al0.27Ga0.73As barriers, grown on an nn-type GaAs (001) substrate. The QW, with its center located 207 nm below the surface, was modulation doped on one side, with Si δ\delta-doping ([Si] = 1×10161\times 10^{16} m-2) at the center of the AlAs/GaAs/AlAs (2 nm/3 nm/2 nm) SL located 75 nm above the QW (inset of Fig. 1) Gardner et al. (2016). The Si δ\delta-doping in the thin GaAs layer provides mobile electrons not only in the QW 75-nm away but also in the neighboring AlAs layers Umansky et al. (2009); Gardner et al. (2016); Manfra (2014); Chung et al. (2020); Friedland et al. (1996). The mobile electrons in the AlAs layers provide screening of the disorder potential created by the ionized Si donors. The wafer was processed into a 120-μ\mum-wide Hall bar with voltage-probe distance of 100 μ\mum and fitted with a Ti/Au front gate. The nn-type substrate was used as a back gate. Measurements were done at temperatures of 0.270.274.34.3 K using a standard lock-in technique.

Figure 1 shows the magnetotransport of the sample measured at 1.6 K. Here, we show data taken at a positive front gate voltage (VFGV_{\text{FG}}) of 0.5 V, which is supposed to increase the density of mobile electrons in the SL. Interestingly, despite the presence of mobile electrons in the SL, there are integer quantum Hall effects at Landau-level filling factor ν=1,2\nu=1,2, and 44, where the longitudinal resistance (RxxR_{xx}) drops to zero and the Hall resistance (RxyR_{xy}) is quantized. From the Shubnikov-de Haas oscillations, we obtained a sheet carrier density of 1.25×10151.25\times 10^{15} m-2, which agrees within 3% with the value deduced from the slope of RxyR_{xy}. This suggests that, even if the SL contains conduction electrons, they apparently do not contribute to transport. We confirmed similar results for VFGV_{\text{FG}} up to 0.8 V.

Refer to caption
Figure 2: VFGV_{\text{FG}} dependence of nQWn_{\text{QW}} obtained from RxyR_{xy} at B=±0.2B=\pm 0.2 T. Blue and red curves show nQWn_{\text{QW}} obtained by sweeping VFGV_{\text{FG}} at 1.6 and 4.3 K, respectively. The dashed blue line is a linear fit for the up sweep. Open circles show nQWn_{\text{QW}} in the equilibrium state (see main text for details). Black dashed line is a fit using a double exponential function. Inset shows the time evolution of nQWn_{\text{QW}} at VFG=1.2V_{\text{FG}}=-1.2 and 1.3-1.3 V at 4.3 K.

Figure 2 shows the VFGV_{\text{FG}} dependence of the sheet carrier density deduced from RxyR_{xy} at 0.2 T. The blue solid curve was obtained by sweeping VFGV_{\text{FG}} at 1.6 K. As shown above, at 1.6 K the measured RxyR_{xy} reflects exclusively the carrier density in the quantum well (nQWn_{\text{QW}}), and not that in the SL. As we decreased VFGV_{\text{FG}} from 0.8 V, nQWn_{\text{QW}} remained almost constant for 0.7-0.7 <VFG<<V_{\text{FG}}< 0.80.8 V (region I). This is consistent with the expectation that the SL contains mobile electrons, which screen the electric field from the front gate and thereby suppress its effect on nQWn_{\text{QW}}. A distinct change in nQWn_{\text{QW}} occurs only at VFG<0.7V_{\text{FG}}<-0.7 V (region II), indicating that the screening capability of the SL is significantly decreased in region II. Upon increasing VFGV_{\text{FG}}, we observed a pronounced hysteresis in region II, where nQWn_{\text{QW}} changed at a faster rate, with an overshoot near the boundary with region I. The rate of change dnQWn_{\text{QW}}/dVFG=3.5×1015V_{\text{FG}}=3.5\times 10^{15} m-2V-1 for the up sweep, shown by the blue dashed line, was consistent with the geometrical capacitance between the front gate and the center of the QW calculated from the distance (207 nm) and the permittivity of AlGaAs (ϵ=13\epsilon=13). This implies that, upon increasing VFGV_{\text{FG}} in region II, electrons accumulate only in the QW, resulting in a metastable state in which the QW (SL) is overpopulated (underpopulated) with respect to its equilibrium density. We conjecture that this results from the difficulty to inject charge into the SL once it becomes close to depletion and poorly conducting. The red curve in Fig. 2, obtained by sweeping VFGV_{\text{FG}} at 4.3 K, shows similar behavior, while the boundary between regions I and II shifts to a more negative VFGV_{\text{FG}}, with a smaller overshoot in the up sweep.

Turning our attention to region I, we notice that nQWn_{\text{QW}} is not constant, but varies slightly with VFGV_{\text{FG}}. This indicates that part of the electric field from the gate penetrates the SL populated with electrons. This is reasonable, as the SL is not a perfect metal; it has only a finite DOS, that is, a finite screening capability. In turn, by analyzing the change in nQWn_{\text{QW}} with VFGV_{\text{FG}} as shown later, we can quantify the DOS, and hence the screening capability, of the SL. (See Ref. Eisenstein et al. (1994) for the principle of this field-penetration technique.)

Refer to caption
Figure 3: red(a) Quantum capacitance CSLC_{\text{SL}} of the AlAs layers comprising the SL calculated from the fitting of nQWn_{\text{QW}} in the equilibrium state. The right axis shows the corresponding effective mass for electrons in the SL. Inset shows the equivalent circuit model used to calculate CSLC_{\text{SL}}. We assume CAlAs1=CAlAs2CSLC_{\text{AlAs1}}=C_{\text{AlAs2}}\equiv C_{\text{SL}} (see main text for details). (b) Calculated VFGV_{\text{FG}} dependence of nSLn_{\text{SL}} red(=nAlAs1+nAlAs2=n_{\text{AlAs1}}+n_{\text{AlAs2}}). The right axis indicates nSLn_{\text{SL}} normalized by the doping density NSi=1×1016N_{\text{Si}}=1\times 10^{16} m-2.

Even though we used a very slow sweep rate of 0.67 mV/sec to set VFGV_{\text{FG}}, in region II nQWn_{\text{QW}} gradually increased on a scale of several minutes to several tens of hours after VFGV_{\text{FG}} was set at a constant value (inset of Fig. 2). This was the case even for down sweeps for which the system is closer to equilibrium. Similar temporal behavior was reported in Ref. Rössler et al. (2010). The transient time increased with decreasing temperature and decreasing VFGV_{\text{FG}}. At VFG=1.3V_{\text{FG}}=-1.3 V, equilibrium was not reached even after a few days at 4.3 K. We used the following method to determine the equilibrium value of nQWn_{\text{QW}} at each VFGV_{\text{FG}}, which is essential for evaluating the screening effect. First, we set VFGV_{\text{FG}} at 4.3 K to facilitate the equilibration and waited until nQWn_{\text{QW}} reached a steady value. Then, we decreased the temperature to 1.6 K and determined nQWn_{\text{QW}} from the low-field RxyR_{xy}. By repeating this process for different VFGV_{\text{FG}}, we obtained nQWn_{\text{QW}} as a function of VFGV_{\text{FG}}, which we plot as open circles in Fig. 2. At VFG=0V_{\text{FG}}=0 V, we obtained the same nQWn_{\text{QW}} value as that for the VFGV_{\text{FG}} sweep. However, the difference between the two methods became significant at lower VFGV_{\text{FG}}. We therefore employed the data obtained by the equilibration method for VFGV_{\text{FG}}\leq 0 V and those of the VFGV_{\text{FG}} sweep for VFG>0V_{\text{FG}}>0 V and fit them using a double exponential function (the black dashed line in Fig. 2).

II.2 B. Circuit model

To deduce the excess electron density in the SL and thereby quantitatively characterize the screening effect, we analyzed the charge equilibration among the front gate, redtwo AlAs layers [AlAs1(2)] comprising the SL, and QW using the circuit model shown in the inset of Fig. 3(a). In addition to the geometrical capacitances between the neighboring elements among these (Cb1C_{\text{b1}}, CiC_{\text{i}}, and Cb2C_{\text{b2}}), the model contains the quantum capacitances of the QW (CQWC_{\text{QW}}) and the AlAs layers [CAlAs1(2)C_{\text{AlAs1(2)}}]. The quantum capacitance is expressed as Cα=e2DαC_{\alpha}=e^{2}D_{\alpha}, where Dα=gαmαD_{\alpha}=g_{\alpha}m^{\star}_{\alpha}/2π22\pi\hbar^{2} is the DOS (mαm^{\star}_{\alpha} is the electron effective mass, α\alpha denotes QW or AlAs1(2), ee is the elementary charge, gαg_{\alpha} is the degeneracy, and =h\hbar=h/2π\pi is the reduced Planck constant). Cb1C_{\text{b1}}, CiC_{\text{i}}, and Cb2C_{\text{b2}} are calculated from the layer thicknesses and permittivity and CQWC_{\text{QW}} is known from the effective mass mQW=0.067m0m^{\star}_{\text{QW}}=0.067m_{0} of GaAs (m0m_{0} is the electron mass in vacuum) and the twofold spin degeneracy. This leaves CAlAs1(2)C_{\text{AlAs1(2)}} the only unknown parameters in the model. For the model to be solvable, we need to assume that the two AlAs layers have the same density of states at the Fermi level, that is, CAlAs1=CAlAs2C_{\text{AlAs1}}=C_{\text{AlAs2}} (CSL\equiv C_{\text{SL}}). We confirmed this assumption to be acceptable by noting that the calculated chemical potential difference between the two AlAs layers (up to 7 meV) was smaller than the disorder-broadened tail (a few tens of meV).

We calculate dnQW/dVFG\text{d}n_{\text{QW}}/\text{d}V_{\text{FG}} as a function of VFGV_{\text{FG}} using the equilibrium relation between nQWn_{\text{QW}} and VFGV_{\text{FG}} obtained above. By numerically solving the circuit model with the dnQW/dVFG\text{d}n_{\text{QW}}/\text{d}V_{\text{FG}} value at each VFGV_{\text{FG}} as an input, we can deduce CSLC_{\text{SL}} as a function of VFGV_{\text{FG}}, as shown in Fig. 3(a). CSLC_{\text{SL}} decreases with decreasing VFGV_{\text{FG}}, reflecting the disorder-broadened tail of the DOS. Interestingly, CSLC_{\text{SL}} is not constant even at VFG>0V_{\text{FG}}>0 V, where it keeps increasing with VFGV_{\text{FG}}. Since quantum capacitance is proportional to the DOS at the Fermi level, the obtained CSLC_{\text{SL}} can be translated into the effective mass mSLm^{\star}_{\text{SL}} that would produce the same DOS for parabolic dispersion through the relation DSL=gSLmSLD_{\text{SL}}=g_{\text{SL}}m^{\star}_{\text{SL}}/2π22\pi\hbar^{2}. In thin AlAs layers, quantum confinement and strain split the three-fold valley degeneracy in bulk into one and two, with the former becoming lower in energy for a thickness below 5.55.56.06.0 nm Khisameeva et al. (2019); Van Kesteren et al. (1989). We therefore assumed gSL=2g_{\text{SL}}=2, taking into account the spin degeneracy. The effective mass mSLm^{\star}_{\text{SL}} evaluated in this way is shown on the right axis of Fig. 3(a). In bulk AlAs, the effective masses in the transverse and longitudinal directions of the ellipsoid Fermi surface are 0.22m00.22m_{0} and 0.97m00.97m_{0}, respectively Vurgaftman et al. (2001). For AlAs QWs thinner than 6.0 nm, the 2DES occupies the lower non-degenerate valley, where experiments report a transverse mass of (0.20.20.30.3)m0m_{0} Yamada et al. (1994); Momose et al. (1999); Vakili et al. (2004). The obtained mSLm^{\star}_{\text{SL}}/m0m_{0}, which approaches the expected value (0.20.20.30.3) with increasing VFGV_{\text{FG}}, is reasonable.

Once CSLC_{\text{SL}} is obtained as a function of VFGV_{\text{FG}}, one can calculate the electron density in the AlAs layers [nAlAs1(2)n_{\text{AlAs1(2)}}] and SL (nSL=nAlAs1+nAlAs2n_{\text{SL}}=n_{\text{AlAs1}}+n_{\text{AlAs2}}). Figure 3(b) shows the VFGV_{\text{FG}} dependence of nSLn_{\text{SL}}. The right axis of the figure indicates the excess electron density normalized by the doping density (NSi=1016N_{\text{Si}}=10^{16} m-2). While nSLn_{\text{SL}} varies almost linearly with VFGV_{\text{FG}}, the slope decreases slightly at VFG<1.0V_{\text{FG}}<-1.0 V.

Refer to caption
Figure 4: (a) Mobility vs. nSL/NSin_{\text{SL}}/N_{\text{Si}}. Open circles (squares) are experimental results for nQW=1.2×1015n_{\text{QW}}=1.2\times 10^{15}m-2 measured at 1.6 K with VFGV_{\text{FG}} set at 4.3 K (room temperature). The error bar represents the uncertainty in nSL/NSin_{\text{SL}}/N_{\text{Si}} for the data taken at VFG=1.70V_{\text{FG}}=-1.70 V. The red line is the total mobility calculated using RI-limited mobility with excess-electron screening (μEES\mu_{\text{EES}}) shown in (b) and fitted to experimental data using BI-limited mobility (μBI\mu_{\text{BI}}) as a parameter. The value of μBI\mu_{\text{BI}} used for the fit is shown by the cyan line. The black line shows the total mobility for the standard model without excess electron screening (μSTD\mu_{\text{STD}}) shown in (b). (b) RI-limited mobility calculated with various models. The dashed green and blue curves were respectively calculated using the analytical formula of μEES\mu_{\text{EES}} for the two cases, nSL/NSi1n_{\text{SL}}/N_{\text{Si}}\ll 1 and (1nSL/NSi)11-n_{\text{SL}}/N_{\text{Si}})\ll 1 Sammon et al. (2018a). The solid red curve is a fit to the two regimes using an empirical formula (see main text for details). The black curve was calculated using the standard model.

II.3 C. Effects on mobility

Now let us investigate the effect of screening on mobility. The symbols in Fig. 4(a) show the 1.6-K mobility (μ\mu) measured at the same carrier density (nQW=1.2×1015n_{\text{QW}}=1.2\times 10^{15} m-2) but with the sample prepared to have different nSL/NSin_{\text{SL}}/N_{\text{Si}} values. The open circles show data obtained by re-adjusting nQWn_{\text{QW}} with the back gate after equilibrating the system at 4.3 K for VFGV_{\text{FG}} (1.3-1.30 V) and cooling the sample to 1.6 K. For this VFGV_{\text{FG}} range, nSL/NSin_{\text{SL}}/N_{\text{Si}} varied between 0.13 and 0.93 [see Fig. 3(b)]. As equilibration was not obtained for VFG<1.3V_{\text{FG}}<-1.3 V at 4.3 K, we employed a different method to achieve smaller nSL/NSin_{\text{SL}}/N_{\text{Si}}. The open squares in Fig. 4(a) show data obtained by applying VFG1.7V_{\text{FG}}\leq-1.7 V at room temperature and re-adjusting nQWn_{\text{QW}} at 1.6 K with the back gate. We confirmed that the SL was already depleted (i.e., nSL/NSi=0n_{\text{SL}}/N_{\text{Si}}=0) for VFG=1.88V_{\text{FG}}=-1.88 V by noting that at 1.6 K the 2DES was depleted at zero back gate voltage. As Fig. 4(a) shows, μ\mu decreased by 37% as nSL/NSin_{\text{SL}}/N_{\text{Si}} decreased from 0.93 to 0.

We characterize the nSL/NSin_{\text{SL}}/N_{\text{Si}} dependence by considering two main sources of disorder in modulation-doped GaAs 2DESs, i.e., background ionized impurities (BIs) and remote ionized impurities (RIs). For the mobility limited by RIs, we used the excess electron screening (EES) model proposed by Sammon et al. Sammon et al. (2018a). The dashed blue and green curves in Fig. 4(b) show the mobility μEES\mu_{\text{EES}} calculated using the EES model for the two limits, nSL/NSi1n_{\text{SL}}/N_{\text{Si}}\ll 1 and 1nSL/NSi11-n_{\text{SL}}/N_{\text{Si}}\ll 1, respectively. The red curve is the fitting using the empirical formula derived in Ref. Sammon et al. (2018a). By adjusting the numerical parameters to connect the two limits, we obtain

μEES=ekF3d5×103.5nSLNSi1.25\mu_{\text{EES}}=\frac{e}{\hbar}k_{\text{F}}^{3}d^{5}\times 10^{3.5\frac{n_{\text{SL}}}{N_{\text{Si}}}-1.25} (1)

Here, kF=(2πnQW)1/2k_{\text{F}}=(2\pi n_{\text{QW}})^{1/2} is the Fermi wave number and d=90d=90 nm is the center-to-center distance between the QW and SL. The red curve in Fig. 4(a) shows the least-squares fit of the total mobility (1(1/μBI+1\mu_{\text{BI}}+1/μEES)1\mu_{\text{EES}})^{-1} based on Matthiessen’s rule, where μBI\mu_{\text{BI}} is the only parameter and we assumed it to be constant. The μBI\mu_{\text{BI}} value obtained from the fit is shown by the cyan line in Fig. 4(a). The EES model well explains the overall nSL/NSin_{\text{SL}}/N_{\text{Si}} dependence of the measured μ\mu, providing good agreement for nSL/NSi0.13n_{\text{SL}}/N_{\text{Si}}\geq 0.13. For nSL/NSi<0.13n_{\text{SL}}/N_{\text{Si}}<0.13, the agreement between the experiment and model becomes less satisfactory, which is because we tried to fit both regimes of nSL/NSi1n_{\text{SL}}/N_{\text{Si}}\ll 1 and 1nSL/NSi11-n_{\text{SL}}/N_{\text{Si}}\ll 1 using Eq. (1) [Fig. 4(b)]. For comparison, we also calculated the mobility using the standard model (μSTD\mu_{\text{STD}}) Hirakawa and Sakaki (1986), assuming independent scattering by (NSinSLN_{\text{Si}}-n_{\text{SL}}) ionized donors. The black lines in Figs. 4(b) and  4(a) show μSTD\mu_{\text{STD}} and the resultant total mobility (1/μBI+1/μSTD)1(1/\mu_{\text{BI}}+1/\mu_{\text{STD}})^{-1}, respectively. The independent-scattering model predicts a mobility way below the experimental result, which in turn demonstrates the importance of the screening by excess electrons.

We also examined the possibility of excess electrons in the SL affecting μBI\mu_{\text{BI}}. Sammon et al. reported that, for strong screening, the contribution of BIs to μBI\mu_{\text{BI}} is canceled out by the image-charge effect when they are located farther than 0.5d0.5d from the center of the QW Sammon et al. (2018b). We calculated μBI\mu_{\text{BI}} by integrating contributions from BIs over different spatial ranges, 0.5d0.5d and dd. The difference between the two cases is less than 1%, thus corroborating our assumption of constant μBI\mu_{\text{BI}}.

II.4 D. Quantum lifetime

Finally, let us investigate the effect of screening on quantum lifetime (τq\tau_{\text{q}}) deduced from Shubnikov–de Haas (SdH) oscillations, a quantity often argued to be a better indicator of sample quality than mobility in terms of FQHEs. Figure 5(a) shows the SdH oscillations measured at 0.27 K at a constant carrier density (nQW=1.2×1015n_{\text{QW}}=1.2\times 10^{15} m-2) under different screening conditions of nSL/NSi=0.93n_{\text{SL}}/N_{\text{Si}}=0.93, 0.180.18, and 0 (corresponding VFGV_{\text{FG}} of 0, 1.20-1.20, and 1.88-1.88 V, respectively). Under the well-screened condition (nSL/NSi=0.93n_{\text{SL}}/N_{\text{Si}}=0.93), minima at odd filling factors due to spin splitting are more pronounced, indicating the influence of screening. We extracted the quantum lifetime τq\tau_{\text{q}} by using the functional form of SdH oscillations, given as Coleridge (1991)

ΔR=4R0exp(πωcτq)χ(T),\Delta R=4R_{0}\text{exp}\left(\frac{-\pi}{\omega_{\text{c}}\tau_{\text{q}}}\right)\chi(T),\\ (2)

with

χ(T)=2π2kBTωcsinh2π2kBTωc.\chi(T)=\cfrac{\cfrac{2\pi^{2}k_{\text{B}}T}{\hbar\omega_{\text{c}}}}{\text{sinh}{\cfrac{2\pi^{2}k_{\text{B}}T}{\hbar\omega_{\text{c}}}}}.\\ (3)

Here, ΔR\Delta R is the amplitude of the SdH oscillations, ωc\omega_{\text{c}} is the cyclotron frequency, R0R_{0} is the RxxR_{xx} at zero magnetic field, χ(T)\chi(T) is a thermal damping factor, and kBk_{\text{B}} is the Boltzmann constant. Thus, the slope of ΔR\Delta R/R0χ(T)R_{0}\chi(T) vs. 1/B1/B, known as a Dingle plot, shown in the inset of Fig. 5(a) gives the quantum lifetime τq\tau_{\text{q}} 111 For the data in the weak screening regime taken with VFG1.7V_{\text{FG}}\leq-1.7 V set at room temperature, analysis taking into account density inhomogeneity Qian et al. (2017) was necessary to fit the Dingle plot with the correct intercept of 4 at B1=0B^{-1}=0. The density inhomogeneity derived from the fit was 0.6 and 1.8% for VFG=1.70V_{\text{FG}}=-1.70 and 1.88-1.88 V, respectively. . The obtained τq\tau_{\text{q}} is shown by open symbols in Fig. 5(b). In contrast to μ\mu, or transport lifetime (τt=mQWμ/e\tau_{\text{t}}=m_{\text{QW}}\mu/e), τq\tau_{\text{q}} does not show a discernible change as a function of nSL/NSin_{\text{SL}}/N_{\text{Si}}.

Refer to caption
Figure 5: (a) Shubnikov-de Haas oscillations under strong (red), intermediate (black), and weak (blue) screening conditions for the same density. The inset shows the Dingle plot for each case. (b) Quantum lifetime vs. nSL/NSin_{\text{SL}}/N_{\text{Si}}. Open circles (squares) are experimental results measured at 0.27 K with VFGV_{\text{FG}} set at 4.3 K (room temperature). The error bar represents the uncertainty in nSL/NSin_{\text{SL}}/N_{\text{Si}} for the data taken at VFG=1.70V_{\text{FG}}=-1.70 V. The cyan and green lines are calculated lifetimes limited by BIs (τqBI\tau_{\text{qBI}}) and RIs (τqEES\tau_{\text{qEES}}). The dashed magenta line shows the total quantum lifetime.

We compared the measured τq\tau_{\text{q}} with the calculated quantum lifetimes limited by RIs and BIs (τqEES\tau_{\text{qEES}} and τqBI\tau_{\text{qBI}}), which are shown in Fig. 5(b) by the green and cyan lines, respectively. Here, τqEES\tau_{\text{qEES}} was calculated with the EES model Sammon et al. (2018a), whereas τqBI\tau_{\text{qBI}} was calculated with the independent-scattering model using the BI concentration obtained from μBI\mu_{\text{BI}} (=224=224 m2/Vs). The expected total quantum lifetime is shown by the dashed magenta line. Although the measured τq\tau_{\text{q}} is close to the values expected in the weak screening regime, it remains about 2.62.6 ps when nSL/NSin_{\text{SL}}/N_{\text{Si}} increases, much lower than expected in the intermediate and strong screening regimes. This discrepancy was not mitigated even when a more elaborate model was employed, such as one with different BI concentrations in the GaAs QW and AlGaAs barrier layers Sammon et al. (2018b) and remote charges on the sample surface and the back gate Chen et al. (2012); Wang et al. (2013). Extrinsic mechanisms that might reduce the apparent quantum lifetime, such as the finite density gradient Qian et al. (2017) 222An attempt to fit the Dingle-plot data in Fig. 5(a) using the density-gradient model in Ref. Qian et al. (2017) together with the calculated quantum lifetime resulted in a strongly nonlinear curve, which did not fit the experimental results. and the response time of the lock-in amplifier 333Reducing the field sweep rate from 10 mT/sec (which we normally use) to 10 μ\muT/sec did not affect the measured value of μq\mu_{\text{q}}., did not explain the discrepancy, either. Ultra-high-quality samples with much longer τq\tau_{\text{q}}, such as those in Refs. Qian et al. (2017); Fu et al. (2018), might be necessary to observe the predicted screening effect on τq\tau_{\text{q}}. Yet, it is interesting that the visibility of the spin gap varies with nSL/NSin_{\text{SL}}/N_{\text{Si}} even when τq\tau_{\text{q}} remains constant, as we observed. For nSL/NSi=0n_{\text{SL}}/N_{\text{Si}}=0, the density inhomogeneity estimated from the analysis of the Dingle plot Qian et al. (2017) is 1.8%, which may be partly responsible for the poorly developed quantum Hall effects at even as well as odd integer fillings. However, for nSL/NSi=0.18n_{\text{SL}}/N_{\text{Si}}=0.18 and 0.930.93, the estimated density inhomogeneity is less than 0.2% with no clear difference, which cannot account for the difference in the visibility of the spin gap. This suggests that the screening of long-range disorder becomes more important for interaction phenomena such as FQHEs. The broad RxxR_{xx} minimum around B=8B=8 T seen in Fig. 1 is a precursor of the ν=2/3\nu=2/3 FQHE. By investigating FQHEs at lower temperatures under different screening conditions, it will be possible to examine how the energy gap of FQHEs is correlated with the composite fermion mobility Kang et al. (1995) deduced from the resistivity at ν=1/2\nu=1/2.

III III. CONCLUSION

In summary, we investigated the screening effects of SL doping on the mobility and quantum lifetime of a GaAs 2DES by controlling the excess electron density in the SL with a top gate. The dependence of mobility on excess electron density is consistent with theory taking into account the screening effect. On the other hand, the measured quantum mobility was much lower than expected from theory and did not show a discernible change with excess electron density. The excess electrons also affected the depth of the spin-gap minima in the Shubnikov-de Haas oscillations, which suggests the possibility of controlling the visibility of FQHEs in-situ.

IV ACKNOWLEDGEMENTS

The authors thank M. Kamiya and H. Irie for support in the measurements, H. Murofushi for processing the device. and M. A. Zudov for helpful discussions. This work was supported by a JSPS KAKENHI Grant, No. JP15H05854.

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