This paper was converted on www.awesomepapers.org from LaTeX by an anonymous user.
Want to know more? Visit the Converter page.

Fourfold anisotropic magnetoresistance of L10 FePt due to relaxation time anisotropy

Y. Dai These authors contributed equally to this study. Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology and Pohl Institute of Solid State Physics and School of Physics Science and Engineering, Tongji University, Shanghai 200092, China    Y. W. Zhao These authors contributed equally to this study. Center for Advanced Quantum Studies and Department of Physics, Beijing Normal University, Beijing 100875, China    L. Ma    M. Tang    X. P. Qiu Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology and Pohl Institute of Solid State Physics and School of Physics Science and Engineering, Tongji University, Shanghai 200092, China    Y. Liu    Z. Yuan [email protected] Center for Advanced Quantum Studies and Department of Physics, Beijing Normal University, Beijing 100875, China    S. M. Zhou [email protected] Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology and Pohl Institute of Solid State Physics and School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
Abstract

Experimental measurements show that the angular dependence of the anisotropic magnetoresistance (AMR) in L10 ordered FePt epitaxial films on the current orientation and magnetization direction is a superposition of the corresponding dependences of twofold and fourfold symmetries. The twofold AMR exhibits a strong dependence on the current orientation, whereas the fourfold term only depends on the magnetization direction in the crystal and is independent of the current orientation. First-principles calculations reveal that the fourfold AMR arises from the relaxation time anisotropy due to the variation of the density of states near the Fermi energy under rotation of the magnetization. This relaxation time anisotropy is a universal property in ferromagnetic metals and determines other anisotropic physical properties that are observable in experiment.

Introduction.—The fundamental physics of spintronics is the interplay of magnetization in magnetic materials and electrical currents [1]. The electrical resistance of a magnetic device typically depends on the magnetization configuration, resulting in a variety of intriguing magnetoresistance (MR) phenomena, such as spin-Hall MR [2], Rashba-Edelstein MR [3], spin-orbital MR [4], anomalous Hall MR [5], and Hanle MR [6], which are effectively applied in probing a magnetic field or magnetization. As a basic MR effect in ferromagnetic metals (FMs) and alloys, AMR describes the dependence of electrical resistivity on the magnetization direction [7, 8, 9, 10, 11, 12].

AMR and its angular dependence on the current orientation and magnetization direction are attributed to the interaction among the crystal field, exchange field and spin-orbit coupling (SOC) [13, 14, 15]. Most early studies were carried out on polycrystalline samples, in which the symmetry constraint only allowed a twofold term that scaled as cos2φM\cos^{2}\varphi_{M}, where φM\varphi_{M} is the angle between the magnetization and current [16]. Twofold AMR has multiple microscopic mechanisms including ss-dd scattering [14, 17], the intrinsic mechanism from band crossings [18] and band splitting due to lattice distortion [19]. Fourfold AMR has been experimentally observed in Fe, Co and Ni epitaxial films [20, 21, 22, 23, 24], (Ga,Mn)As [25, 26], manganites [27, 28], Fe3O4 [29, 30], Co2MnSi [31] and antiferromagnetic EuTiO3 [32]. It exists in pseudoepitaxial Fe4N films [33, 34, 19] at low temperatures and vanishes at elevated temperatures. The latter was ascribed to the tetragonal lattice distortion in Fe4[19], but this interpretation is not applicable to cubic Ni [21]. Recently, the fourth-order perturbation of SOC was proposed to be the mechanism in cubic crystals [35]. So far, fourfold AMR is still poorly understood.

L10 Fe0.5(Pd1-xPtx)0.5 is an ordered ferromagnetic alloy in which both the degree of chemical ordering and SOC strength are tunable and is therefore an ideal material to investigate the microscopic mechanisms underlying AMR. Systematic measurement of the resistivity of FePt epitaxial films combined with first-principles calculations allows us to gain a thorough understanding of the observed angular dependence of AMR. Using the current-orientation independence as the criterion, we discover that the fourfold AMR arises from the variation in the density of states near the Fermi surface, which results in the relaxation time anisotropy under rotation of the magnetization with respect to the crystallographic axes.

Measured AMR of FePt.— A single-crystal FePt (001) film is epitaxially grown on an MgO (001) substrate and patterned into arcuate Hall bars so that the current direction is continuously variable, as schematized in Fig. 1(a). The degree of chemical ordering SS is controlled by the substrate temperature during fabrication and the postannealing temperature [36]. S=1S=1 for a fully ordered structure, and S=0S=0 for a completely disordered alloy.

Refer to caption
Figure 1: (a) Schematic of AMR measurement. The measured resistivity ρxx\rho_{xx} of the L10 FePt film with S=0.82S=0.82 at point A (𝐉[100]\mathbf{J}\|[100]) and point B (𝐉[110]\mathbf{J}\|[110]) is plotted in (b) and (c), respectively, as a function of the magnetization direction (φM\varphi_{M}) with respect to the sensing current. The solid lines in (b) and (c) correspond to fits using Eq. (1). The fitted parameters Δρ2(4)\Delta\rho_{2(4)} and φ2(4)\varphi_{2(4)} are shown in (d), (e) and (f) as a function of the current orientation (α𝐉\alpha_{\mathbf{J}}) with respect to the crystalline axis [100]. The measurement is carried out at a low temperature of T=10T=10 K.

The magnetization within the (001) plane is rotated to measure the longitudinal resistivity ρxx\rho_{xx} of FePt with S=0.82S=0.82 for currents along [100] and [110], as shown in Fig. 1(b) and (c), respectively. The measured data are effectively fitted using the following superposition of the twofold and fourfold AMR terms:

ρxx(φM)\displaystyle\rho_{xx}(\varphi_{M}) =\displaystyle= ρ0+Δρ2cos2(φM+φ2)\displaystyle\rho_{0}+\Delta\rho_{2}\cos 2(\varphi_{M}+\varphi_{2}) (1)
+Δρ4cos4(φM+φ4),\displaystyle+\Delta\rho_{4}\cos 4(\varphi_{M}+\varphi_{4}),

where φM\varphi_{M} represents the angle between the magnetization and sensing current defined in Fig. 1(a) and ρ0\rho_{0} is the average resistivity independent of φM\varphi_{M}. The last two terms in Eq. (1) correspond to the twofold and fourfold variations in resistivity, with phases of φ2\varphi_{2} and φ4\varphi_{4}, respectively. In Fig. 1(d) and (e), the fitted Δρ2\Delta\rho_{2} and Δρ4\Delta\rho_{4} are plotted as a function of the current direction α𝐉\alpha_{\mathbf{J}}, which is defined by the angle between the current direction and the crystal axis [100] [see Fig. 1(a)]. Δρ2\Delta\rho_{2} is highly sensitive to the sensing current direction and is small and negative at 𝐉[100]\mathbf{J}\|[100] and becomes large and positive at 𝐉[110]\mathbf{J}\|[110]. By contrast, the fourfold term Δρ4\Delta\rho_{4} has a nearly constant magnitude that varies by less than 10% over the range of 0α𝐉900\leq\alpha_{\mathbf{J}}\leq 90^{\circ}. The associated phase φ4\varphi_{4} in the fourfold term is always equal to the current orientation α𝐉\alpha_{\mathbf{J}}, as shown in Fig. 1(f). This result suggests that fourfold AMR is independent of the current orientation and depends only on the magnetization direction with respect to the crystallographic axes. Unlike φ4\varphi_{4}, the phase φ2\varphi_{2} in the twofold term exhibits nonmonotonic variation between 45-45^{\circ} and 4545^{\circ} suggesting competition of multiple components [36].

Refer to caption
Figure 2: Fitted AMR parameters Δρ2\Delta\rho_{2} and Δρ4\Delta\rho_{4} as a function of temperature for samples with different degrees of chemical order. The measurement is carried out under a fixed current orientation that is along [100] in (a) and (b) and along [110] in (c) and (d).

Figure 2 shows Δρ2\Delta\rho_{2} and Δρ4\Delta\rho_{4} that are extracted using Eq. (1) from experimental data [36] as a function of the temperature for samples with various degrees of chemical order. Here, we focus on two sensing current directions along high-symmetry axes, [100] and [110]. For 𝐉[100]\mathbf{J}\|[100], Δρ2\Delta\rho_{2} is negative at large SS [see the orange and blue symbols in Fig. 2(a)]. At intermediate SS, the twofold AMR exhibits a transition from negative at low temperatures to positive at room temperature and above. In the completely disordered sample, Δρ2\Delta\rho_{2} is always positive and nearly invariant with increasing temperature. The temperature dependence of Δρ2\Delta\rho_{2} is strikingly different for 𝐉[110]\mathbf{J}\|[110] in Fig. 2(c), where it decreases with increasing temperature for all samples. Comparing Fig. 2(b) and (d), we find that the fourfold AMR has the same temperature dependence for 𝐉[100]\mathbf{J}\|[100] and 𝐉[110]\mathbf{J}\|[110]. With increasing temperature, Δρ4\Delta\rho_{4} increases for S=1S=1 and decreases for smaller SS. The fourfold AMR vanishes in the sample with S=0S=0.

Twofold AMR.—It is difficult to conclusively determine the AMR dependence on the degree of chemical ordering and temperature from Fig. 2 because both factors influence the AMR simultaneously. To obtain deeper insight into this dependence, we replot the measured Δρ2\Delta\rho_{2} of all the samples as a function of the corresponding average resistivity ρ0\rho_{0} for 𝐉[100]\mathbf{J}\|[100] in Fig. 3(a). A common trend in the experimental data is thus revealed: Δρ2\Delta\rho_{2} is negative at low resistivities and becomes positive at large ρ0\rho_{0}. For the fully disordered alloy with S=0S=0, Δρ2\Delta\rho_{2} is a positive constant that is independent of ρ0\rho_{0}.

Refer to caption
Figure 3: Fitted Δρ2\Delta\rho_{2} as a function of the average resistivity ρ0\rho_{0} for current along [100] (a) and [110] (c). Inset of (a): Calculated Δρ2\Delta\rho_{2} as a function of ρ0\rho_{0} for fully-ordered FePt with thermal lattice disorder. Calculated band structure with SOC along 100\langle 100\rangle (b) and along 110\langle 110\rangle (d). The magnetization is parallel to ΓM\Gamma\mathrm{M}^{\prime} (ΓX\Gamma\mathrm{X}^{\prime}) and perpendicular to ΓM\Gamma\mathrm{M} (ΓX\Gamma\mathrm{X}). The colors of the energy bands indicate the spin projection along the quantization axis. The circles with different sizes represent the spsp components of the Bloch states.

We perform a first-principles transport calculation for fully-ordered L10 FePt with S=1S=1, where temperature-induced lattice disorder is introduced to account for the finite resistivity [36, 44]. By increasing the temperature, we qualitatively reproduce the resistivity dependence of twofold AMR, as shown in the inset of Fig. 3(a), and the difference at small ρ0\rho_{0} is attributed to the large perpendicular anisotropy of highly ordered FePt [36]. The negative Δρ2\Delta\rho_{2} at low ρ0\rho_{0} and positive value at large ρ0\rho_{0} can be understood by analyzing the band structure of L10 FePt. Figure 3(b) shows the energy bands near the Fermi energy EFE_{F} along the high-symmetry direction 100\langle 100\rangle for parallel (ΓM\Gamma\mathrm{M}^{\prime}) or perpendicular (ΓM\Gamma\mathrm{M}) magnetizations. In the low disorder regime, the twofold AMR is nearly independent of the scattering rate or relaxation time, suggesting an intrinsic contribution due to band (anti)crossing [18]. These special band crossings are a consequence of symmetry at a given 𝐌\mathbf{M}, whereas rotating 𝐌\mathbf{M} breaks the symmetry and lifts the band degeneracy. As the energy bands near EFE_{F} have the characteristics of spsp-dd hybridization, we focus on the itinerant spsp bands (marked by empty circles) that have a stronger influence on transport than the more localized dd bands. Rotating 𝐌\mathbf{M} from [100] to [010] results in the disappearance of a crossing of spsp bands along [100] (ΓM\Gamma\mathrm{M}^{\prime}) (marked by purple ellipses) and hence slightly increases the resistivity, corresponding to a negative Δρ2\Delta\rho_{2}. As we increase ρ0\rho_{0} by increasing the temperature or decreasing SS, the contribution of disorder scattering to the AMR becomes more important. Most of the dd bands near EFE_{F} have the minority-spin component [45], and therefore, spsp-dd_{\downarrow} scattering leads to a positive Δρ2\Delta\rho_{2} [16].

For 𝐉[110]\mathbf{J}\|[110], an arbitrary ρ0\rho_{0} corresponds to different Δρ2\Delta\rho_{2} depending on the details of the degree of chemical order; see Fig. 3(c). This behavior implies that the AMR mainly arises from extrinsic disorder scattering, in agreement with the calculated band structure. As shown in Fig. 3(d), the energy bands along [110] near EFE_{F} are unchanged for 𝐌[110]\mathbf{M}\|[110] (ΓX\Gamma\mathrm{X}^{\prime}) or 𝐌[11¯0]\mathbf{M}\|[1\bar{1}0] (ΓX\Gamma\mathrm{X}) and hence make no intrinsic contribution to the AMR. When disorder scattering becomes stronger with increasing temperature, the resulting band smearing enables the energy bands farther away from EFE_{F} to affect electron transport. The band crossings along ΓX\Gamma\mathrm{X}^{\prime} become anticrossing gaps along ΓX\Gamma\mathrm{X} (marked by purple ellipses), corresponding to a negative Δρ2\Delta\rho_{2} from the intrinsic mechanism. Therefore, the experimentally measured Δρ2\Delta\rho_{2} for all SS decreases with increasing temperature.

Refer to caption
Figure 4: (a) Fitted Δρ4\Delta\rho_{4} from experimentally measured resistivity. (b) Calculated Δρ4\Delta\rho_{4} as a function of the total resistivity for fully-ordered FePt. (c) Calculated DOS of FePt as a function of the magnetization direction rotated within the (001) plane. The black circles and red squares are calculated at EFE_{F} and EF0.0185E_{F}-0.0185 eV, respectively. The Brillouin zone is sampled by 24003\sim 2400^{3} kk-points for convergence. (d) The difference in the finite-temperature DOS for 𝐌[100]\mathbf{M}\|[100] and 𝐌[110]\mathbf{M}\|[110] calculated using Eq. (3).

Fourfold AMR.—The experimental fourfold AMR Δρ4\Delta\rho_{4} is plotted in Fig. 4(a) as a function of the measured average resistivity ρ0\rho_{0}. The data extracted from different sensing current directions overlap with each other. With increasing ρ0\rho_{0}, Δρ4\Delta\rho_{4} of the highly ordered samples increases and it decreases for samples with smaller SS. The strong dependence of Δρ4\Delta\rho_{4} on the ordering degree and temperature indicates that the physical mechanism for fourfold AMR is related to scattering. Moreover, the measurements with various sample thicknesses confirm that fourfold AMR is not a surface effect but exists in bulk L10 FePt [36]. A first-principles transport calculation of fully-ordered L10 FePt also reproduces the nonmonotonic ρ0\rho_{0}-dependent fourfold AMR: with increasing temperature-induced thermal lattice disorder, the calculated Δρ4\Delta\rho_{4} increases to a maximum and then decreases, as shown in Fig. 4(b). In addition, the calculated resistivity also exhibits maxima and minima at 𝐌100\mathbf{M}\|\langle 100\rangle and 𝐌110\mathbf{M}\|\langle 110\rangle, respectively [36], in agreement with experiment. The calculated Δρ4\Delta\rho_{4} is much larger than the experimental values and this discrepancy may be attributed to the neglected spin fluctuation and chemical disorder in the calculation.

Fourfold AMR in Fe4N is attributed to energy-band hybridization resulting from the interplay of SOC and tetragonal distortion [19]. The predictions of this theory, however, contradict both our experimental observations and calculations for Δρ4\Delta\rho_{4}. Experimentally, the structural L10-A1 phase transition of FePt occurs near 13001300^{\circ}C  [46], below which the tetragonal structure of FePt films is sustained. However, the measured Δρ4\Delta\rho_{4} becomes very small near 400 K far below the phase transition temperature, as seen in Fig. 2(b) and (d), especially for small SS. In our calculation, the tetragonal structure of L10 FePt is not affected by temperature, whereas the calculated Δρ4\Delta\rho_{4} exhibits a nonmonotonic dependence.

Under rotation of the magnetization, SOC mediates the electronic states in the crystal field, leading to a variation in the density of states (DOS) at the Fermi energy. Using a hybrid Wannier-Bloch representation [47], we calculate the DOS of fully-ordered L10 FePt and two typical cases at EFE_{F} and EF0.0185E_{F}-0.0185 eV are plotted in Fig. 4(c), both of which show fourfold symmetry and the maxima (minima) at 𝐌100\mathbf{M}\|\langle 100\rangle (𝐌110\mathbf{M}\|\langle 110\rangle). The electronic scattering rate at the Fermi level is inversely proportional to the relaxation time and determined by the Fermi golden rule [48],

1τ2π|f|V|i|2DfDi.\frac{1}{\tau}\propto\frac{2\pi}{\hbar}|\langle f|V|i\rangle|^{2}D_{f}D_{i}. (2)

Here, we only consider the dominant elastic scattering contribution due to the scattering potential VV. In Eq. (2), |i|i\rangle and |f|f\rangle are the initial and final states, respectively. DiD_{i} and DfD_{f} represent the densities of these states at the Fermi energy. For 𝐌100\mathbf{M}\|\langle 100\rangle, the increase in the DOS enhances the scattering probability of Bloch states and thus reduces the relaxation time. This picture explains why the fourfold AMR only depends on the magnetization direction with respect to the crystallographic axes and is invariant for different sensing current directions.

With increasing chemical and lattice disorder, energy-band smearing causes states away from EFE_{F} to be incorporated into the DOS at the Fermi energy. By introducing a Fermi-Dirac distribution function at finite temperature f(E,T)f(E,T), we calculate the DOS at EFE_{F} as

D(EF,T)=𝑑ED(E)[f(E,T)E].D(E_{F},T)=\int_{-\infty}^{\infty}dE\,D(E)\left[-\frac{\partial f(E,T)}{\partial E}\right]. (3)

The difference of calculated DOS between 𝐌100\mathbf{M}\|\langle 100\rangle and 𝐌110\mathbf{M}\|\langle 110\rangle is plotted in Fig. 4(d). The anisotropic DOS also exhibits a nonmonotonic dependence on temperature that is consistent with that of the fourfold AMR. This nonmonotonic behavior is attributed to the fact that the DOS has a larger anisotropy at EF+ϵE_{F}+\epsilon than at EFE_{F}. Thus, increasing the temperature enables the energy EF+ϵE_{F}+\epsilon to contribute to transport and enhances the fourfold AMR. An enough high temperature involves a very large energy range and eventually averages out the anisotropy in the DOS. Note that the calculated Δρ4\Delta\rho_{4} in Fig. 4(b) and anisotropic DOS in Fig. 4(d) decrease more slowly with the temperature than the experimental Δρ4\Delta\rho_{4} in Fig. 4(a). This result is obtained because chemical disorder and spin wave excitations, which are not included in the calculation, strongly suppress the fourfold AMR in reality by breaking local symmetry.

With SOC that couples spin and real space, the particular magnetization orientation affects the electronic structure and thus modulates the DOS near Fermi surface. Such a modulation follows the crystal symmetry and hence leads to fourfold AMR in any metallic ferromagnets with fourfold symmetry. By carefully studying the literature, we have found that the measured fourfold AMR in Co [21], Ni [24] and Fe4[33] are independent of current direction in agreement with our findings. It indicates that the proposed microscopic mechanism for the fourfold AMR is universal for ferromagnetic metals.

In addition to resistivity, relaxation time is important for Gilbert damping that characterizes dynamical magnetization dissipation [49]. At low temperature, Kamberský’s breathing Fermi surface model [50] explicitly shows the proportionality of Gilbert damping and relaxation time, while Gilbert damping at high temperature is inversely proportional to relaxation time due to the dominant interband scattering [51]. This nonmonotonic relationshop has been demonstrated by first-principles calculations [52]. Thus the relaxation time anisotropy due to the modulation of DOS shall lead to anisotropic Gilbert damping [53], which was recently observed in single-crystal ferromagnets but has not yet been understood [54, 55].

Refer to caption
Figure 5: (a) Measured Δρ4\Delta\rho_{4} of L10 ordered Fe0.5(Pd1-xPtx)0.5 20-nm-thick films as a function of Pt concentration xx at 10 K. The inset shows the measured ρxx\rho_{xx}. (b) Calculated Δρ4\Delta\rho_{4} of FePt as a function of scaled SOC strength. The black dashed line indicates the SOC strength of FePd. The dotted line illustrates quadratic dependence.

The isoelectronic properties of Pt and Pd enable the SOC strength to be mediated by changing the Pt/Pd atomic concentration, whereas other parameters, such as the lattice constant, saturation magnetization, and Curie temperature, remain almost the same [56, 57]. We measure the resistivity and AMR in (001) L10 Fe0.5(Pd1-xPtx)0.5 for different Pt concentrations xx. The sheet resistivity exhibits a maximum near x=0.5x=0.5 and thus obeys Nordheim’s rule [58], whereas the magnitude of Δρ4\Delta\rho_{4} increases with xx and is nearly independent of the current orientation as shown in Fig. 5(a). The enhanced Δρ4\Delta\rho_{4} with increasing SOC strength is reproduced by first-principles transport calculation by artificially reducing SOC of FePt; see Fig. 5(b). At small SOC strength, Δρ4\Delta\rho_{4} exhibits a quadratic dependence on SOC.

Summary.— We studied the AMR of (001) L10 FePt epitaxial films by systematically varying the degree of chemical order and temperature and identified the underlying microscopic mechanisms of AMR. Twofold AMR arises from the competition between the intrinsic mechanism due to magnetization-orientation-dependent band crossings and the extrinsic scattering mechanism that results from thermal and chemical disorder scattering. Fourfold AMR is attributed to the variation in the DOS and hence in the relaxation time at the Fermi surface that is induced by rotating the magnetization. Current-orientation independence is the main criterion used to identify this mechanism. The relaxation time anisotropy is universal for other FMs with proper symmetry and is a possible mechanism for the anisotropic Gilbert damping observed in recent experiments.

Acknowledgements.
This study was supported by the National Key R&D Program of China (Grant No. 2017YFA0303202) and National Natural Science Foundation of China (Grant Nos. 11874283, 51801152, 11774064, 12174028 and 11734004).

References

  • [1] See the collections of articles in Ultrathin Magnetic Structures I-IV, edited by J. A. C. Bland and B. Heinrich (Springer-Verlag, Berlin, 1994–2005).
  • [2] H. Nakayama, M. Althammer, Y. T. Chen, K. Uchida, Y. Kajiwara, D. Kikuchi, T. Ohtani, S. Geprägs, M. Opel, S. Takahashi, R. Gross, G. E. W. Bauer, S. T. B. Goennenwein, and E. Saitoh, Phys. Rev. Lett. 110, 206601 (2013).
  • [3] H. Nakayama, Y. Kanno, H. An, T. Tashiro, S. Haku, A. Nomura, and K. Ando, Phys. Rev. Lett. 117, 116602 (2016).
  • [4] L. Zhou, H. Song, K. Liu, Z. Luan, P. Wang, L. Sun, S. Jiang, H. Xiang, Y. Chen, J. Du, H. Ding, K. Xia, J. Xiao, and D. Wu, Sci. Adv. 4, eaao3318 (2018).
  • [5] Y. Yang, Z. Luo, H. Wu, Y. Xu, R.-W. Li, S. J. Pennycook, S. Zhang, Y. Wu, Nat. Commun. 9, 2255 (2018).
  • [6] S. Vélez, V. N. Golovach, A. Bedoya-Pinto, M. Isasa, E. Sagasta, M. Abadia, C. Rogero, L. E. Hueso, F. S. Bergeret, and F. Casanova, Phys. Rev. Lett. 116, 016603 (2016).
  • [7] W. Thomson, Proc. R. Soc. London 8, 546 (1857).
  • [8] L. L. Campbell, in Galvanomagnetic and Thermomagnetic Effects: The Hall and Allied Phenomena (Longmans, Green and Company, London, 1923).
  • [9] R. I. Potter, Phys. Rev. B 10, 4626 (1974).
  • [10] T. Hupfauer, A. Matos-Abiague, M. Gmitra, F. Schiller, J. Loher, D. Bougeard, C. H. Back, J. Fabian, and D. Weiss, Nat. Commun. 6, 7374 (2015).
  • [11] L. Nadvorník, M. Borchert, L. Brandt, R. Schlitz, K. A. de Mare, K. Výborný, I. Mertig, G. Jakob, M. Kläui, S. T. B. Goennenwein, M. Wolf, G. Woltersdorf, T. Kampfrath, Phys. Rev. X 11, 021030 (2021).
  • [12] J.-H. Park, H.-W. Ko, J.-M. Kim, J. Park, S.-Y. Park, Y. Jo, B.-G. Park, S. K. Kim, K.-J. Lee and K.-J. Kim, Sci. Rep. 11, 20884 (2021).
  • [13] L. Berger and S. A. Friedberg, Phys. Rev. 165, 670 (1968).
  • [14] I. A. Campbell, A. Fert, and O. Jaoul, J. Phys. C 3, S95 (1970).
  • [15] S. Kokado, M. Tsunoda, K. Harigaya, and A. Sakuma, J. Phys. Soc. Jpn. 81, 024705 (2012).
  • [16] T. R. McGuire and R. I. Potter, IEEE Trans. Magn. 11, 1018 (1975).
  • [17] M. Trushin, K. Výborný, P. Moraczewski, A. A. Kovalev, J. Schliemann, and T. Jungwirth, Phys. Rev. B 80, 134405 (2009).
  • [18] F. L. Zeng, Z. Y. Ren, Y. Li, J. Y. Zeng, M. W. Jia, J. Miao, A. Hoffmann, W. Zhang, Y. Z. Wu, and Z. Yuan, Phys. Rev. Lett. 125, 097201 (2020).
  • [19] S. Kokado and M. Tsunoda, J. Phys. Soc. Jpn. 84, 094710 (2015).
  • [20] R. P. van Gorkom, J. Caro, T. M. Klapwijk, and S. Radelaar, Phys. Rev. B 63, 134432 (2001).
  • [21] X. Xiao, J. H. Liang, B. L. Chen, J. X. Li, D. H. Ma, Z. Ding, and Y. Z. Wu, J. Appl. Phys. 118, 043908 (2015).
  • [22] F. L. Zeng, C. Zhou, M. W. Jia, D. Shi, Y. Huo, W. Zhang, Y. Z. Wu, J. Magn. Magn. Mater. 499, 166204 (2020).
  • [23] J. Ye, W. He, Q. Wu, H. L. Liu, X. Q. Zhang, Z. Y. Chen, and Z. H. Cheng, Sci. Rep. 3, 2148 (2013).
  • [24] X. Xiao, J. X. Li, Z. Ding, Y. Z. Wu, J. Appl. Phys. 118, 203905 (2015).
  • [25] W. Limmer, M. Glunk, J. Daeubler, T. Hummel, W. Schoch, R. Sauer, C. Bihler, H. Huebl, M. S. Brandt, S. T. B. Goennenwein, Phys. Rev. B 74, 205205 (2006).
  • [26] A. W. Rushforth, K. Výborný, C. S. King, K. W. Edmonds, R. P. Campion, C. T. Foxon, J. Wunderlich, A. C. Irvine, P. Vašek, V. Novák, K. Olejník, J. Sinova, T. Jungwirth, and B. L. Gallagher, Phys. Rev. Lett. 99, 147207 (2007).
  • [27] Y. Bason, J. Hoffman, C. H. Ahn, and L. Klein, Phys. Rev. B 79, 092406 (2009).
  • [28] N. Naftalis, Y. Bason, J. Hoffman, X. Hong, C. H. Ahn, and L. Klein, J. Appl. Phys. 106, 023916 (2009).
  • [29] N. Naftalis, A. Kaplan, M. Schultz, C. A. F. Vaz, J. A. Moyer, C. H. Ahn, and L. Klein, Phys. Rev. B 84, 094441 (2011).
  • [30] Z. Ding, J. X. Li, J. Zhu, T. P. Ma, C. Won, and Y. Z. Wu, J. Appl. Phys. 113, 17B103 (2013).
  • [31] M. Oogane, A. P. McFadden, Y. Kota, T. L. Brow-Heft, M. Tsunoda, Y. Ando, and C. J. Palmstróm, Jpn. J. Appl. Phys. 57, 063001 (2018).
  • [32] K. Ahadi, X. Z. Lu, S. Salmani-Rezaie, P. B. Marshall, J. M. Rondinelli, and S. Stemmer, Phys. Rev. B. 99, 041106R (2019).
  • [33] M. Tsunoda, H. Takahashi, S. Kokado, Y. Komasaki, A. Sakuma, and M. Takahashi, Appl. Phys. Express 3, 113003 (2010).
  • [34] Z. R. Li, X. P. Feng, X. C. Wang, W. B. Mi, Mater. Res. Bull. 65, 175 (2015).
  • [35] Y. Yahagi, D. Miura, and A. Sakuma, J. Phys. Soc. Jpn. 89, 044714 (2020).
  • [36] See Supplemental Material at [URL] for the details of sample fabrication, AMR measurements, analysis of fitting parameters, first-principles transport calculations, thickness-dependence of Δρ4\Delta\rho_{4} and additional comparison between experiment and calculation, which includes Refs. [37, 38, 39, 40, 41, 42, 43].
  • [37] A. Cebollada, D. Weller, J. Sticht, G. R. Harp, R. F. C. Farrow, R. F. Marks, R. Savoy, and J. C. Scott, Phys. Rev. B 50, 3419 (1994).
  • [38] E. Yang, D. E. Laughlin, J.-G. Zhu, IEEE Trans. Magn. 48, 7 (2012).
  • [39] O. K. Andersen, Z. Pawlowska, and O. Jepsen, Phys. Rev. B 34, 5253 (1986).
  • [40] Y. Liu, A. A. Starikov, Z. Yuan, and P. J. Kelly, Phys. Rev. B 84, 014412 (2011).
  • [41] D. Weller, A. Moser, L. Folks, M. E. Best, W. Lee, M. F. Toney, M. Schwickert, J.-U. Thiele, and M. F. Doerner, IEEE Trans. Magn. 36, 10 (2000).
  • [42] S. Okamoto, N. Kikuchi, O. Kitakami, T. Miyazaki, Y. Shimada, and K. Fukamichi, Phys. Rev. B 66, 024413 (2002).
  • [43] E. H. Sondheimer, Adv. Phys. 1, 1 (1952).
  • [44] A. A. Starikov, Y. Liu, Z. Yuan, and P. J. Kelly, Phys. Rev. B 97, 214415 (2018).
  • [45] S. A. Khan, P. Blaha, H. Ebert, J. Minár, and O. Šipr, Phys. Rev. B 94, 144436 (2016).
  • [46] T. B. Massalski, J. L. Murray, L. H. Bennet, and H. Baker, ed., Binary Phase Diagrams, (ASM International, Materials Park, Ohio, 1986), p. 1096.
  • [47] Z. Yuan and P. J. Kelly, Phys. Rev. B 93, 224415 (2016).
  • [48] J. M. Ziman, Electrons and Phonons, (Oxford University Press, Oxford, 1960).
  • [49] T. L. Gilbert, IEEE Trans. Magn. 40, 3443 (2004).
  • [50] V. Kamberský, Can. J. Phys. 48, 2906 (1970).
  • [51] V. Kamberský, Phys. Rev. B 76, 134416 (2007).
  • [52] K. Gilmore, Y. U. Idzerda, M. D. Stiles Phys. Rev. Lett. 99, 027204 (2007).
  • [53] K. Gilmore, M. D. Stiles, J. Seib, D. Steiauf, and M. Fähnle, Phys. Rev. B 81, 174414 (2010).
  • [54] Y. Li, F. L. Zeng, S. S. L. Zhang, H. Shin, H. Saglam, V. Karakas, O. Ozatay, J. E. Pearson, O. G. Heinonen, Y. Z. Wu, A. Hoffmann, and W. Zhang, Phys. Rev. Lett. 122, 117203 (2019).
  • [55] H. Xia, Z. R. Zhao, F. L. Zeng, H. C. Zhao, J. Y. Shi, Z. Zheng, X. Shen, J. He, G. Ni, Y. Z. Wu, L. Y. Chen, and H. B. Zhao, Phys. Rev. B 104, 024404 (2021).
  • [56] P. He, L. Ma, Z. Shi, G. Y. Guo, J.-G. Zheng, Y. Xin and S. M. Zhou, Phys. Rev. Lett. 109, 066402 (2012).
  • [57] P. He, X. Ma, J. W. Zhang, H. B. Zhao, G. Lüpke, Z. Shi, and S. M. Zhou, Phys. Rev. Lett. 110, 077203 (2013).
  • [58] L. Nordheim, Ann. Phys. 9, 664 (1931).